Selected Examples of Delivered Products and Services (Customer Sector in Parentheses):


Thickness measurement system for ultra thin samples
•    Confocal Nanoprofilometer
•    Non-contact laser nano-roughness meter for measurement of polished glass or semiconductor surfaces in 0.1-30 nm range (semiconductor)
•    Automated variable wavelength (VAWI) micro-interferometer for measurements of refractive index and birefringence profiles of optical and textile fibers or other phase objects (textile, optical & telecommunications)
•    LST-Laser Scanning Tomograph for investigating
semiconductor wafer quality (semiconductor)
•    AOA - acousto-optic analyser for identification of RF signals (defense)
•    Enhanced DIC microinterferometer for surface smoothness investigations (optical, machine parts and semiconductor)
•     Fizeau interferometer for surface flatness investigations of precise metal and optical elements (machine parts, automotive)



Selected Skills:

•    Development of new measurement and observational techniques and systems
•    Design and technology of optical and optoelectronic devices and components
•    Manufacturing unique and specialized optical and optoelectronic systems
•    Advanced software development



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